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Uniformity
The critical success factor
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Shape-agnostic computing
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MPC for uniformity and linearity
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Physical model for masks and wafers
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GPU-accelerated design platform
About D
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About D
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S
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2
S Technology Highlights
Technologies
Uniformity
The critical success factor
Mask Uniformity
Path to wafer uniformity
Wafer Uniformity
Achieving the best process window
GPU Acceleration
Practical full-reticle processing
Curvilinear
Better mask and wafer quality
Pixel Domain
Shape-agnostic computing
Products
PLDC
MPC for uniformity and linearity
TrueMask
®
ILT
Full-chip, Entirely Manufacturable™ ILT
TrueModel
®
Physical model for masks and wafers
CDP
GPU-accelerated design platform
About D
2
S
About D
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S
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Page 35
D
2
S CEO AKI FUJIMURA TO PARTICIPATE IN 22‐NM MANUFACTURING PANEL AT DAC 2010
Press Release • March 25, 2010
Panel of Experts to Discuss Design and Lithography Challenges for 22‐nm Manufacturing
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eBeam Initiative Membership Grows to 27 - Initiative Introduces DFEB Mask Roadmap for High Volume Integrated Circuits
Press Release • February 23, 2010
Initiative Introduces Design For E‐Beam Mask Roadmap for High‐Volume Integrated Circuits
English
日本語
D
2
S Redefines Mask Rules for the 22-nm and Smaller Technology Nodes
Press Release • February 23, 2010
Design for eBeam (DFEB) Mask Technology Makes Advanced Photomask Production Practical
English
日本語
eBeam Initiative Introduces Design for eBeam Methodology Guidelines and Training Courses
Press Release • November 9, 2009
Guidelines and Training Build on Milestones Achieved During 2009
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D
2
S to Speak at the International Conference on Computer-Aided Design
Press Release • October 12, 2009
Tutorial to Further Educate Design Community on the Future of E‐beam Direct Write Technologies
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eBeam Initiative Members Collaborate to Enhance Design for eBeam Throughput:
Press Release • October 1, 2009
D
2
S' DFEB Packed Stencil Technology and Advantest Corporation’s Direct Write Lithography Equipment Increase DFEB Character Set by More Than 4X, October 1, 2009
English
日本語
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