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Uniformity
The critical success factor
Mask Uniformity
Path to wafer uniformity
Wafer Uniformity
Achieving the best process window
GPU Acceleration
Practical full-reticle processing
Curvilinear
Better mask and wafer quality
Pixel Domain
Shape-agnostic computing
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PLDC
MPC for uniformity and linearity
TrueMask
®
ILT
Full-chip, Entirely Manufacturable™ ILT
TrueModel
®
Physical model for masks and wafers
CDP
GPU-accelerated design platform
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About D
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2
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Technologies
Uniformity
The critical success factor
Mask Uniformity
Path to wafer uniformity
Wafer Uniformity
Achieving the best process window
GPU Acceleration
Practical full-reticle processing
Curvilinear
Better mask and wafer quality
Pixel Domain
Shape-agnostic computing
Products
PLDC
MPC for uniformity and linearity
TrueMask
®
ILT
Full-chip, Entirely Manufacturable™ ILT
TrueModel
®
Physical model for masks and wafers
CDP
GPU-accelerated design platform
About D
2
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About D
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Page 18
EETimes: Useful Waste: Rethinking Computing in the GPU Era
News • May 6, 2021
D
2
S CEO Aki Fujimura offers his views on the impact of GPU-based computing
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Semiconductor Engineering: How Extensively Will Curvilinear ILT Be Used For EUV Photomasks?
News • April 29, 2021
Looking beyond hotspots to more extensive use of curvilinear shapes.
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Semiconductor Digest: Applications, Challenges For Using AI In Fabs
News • April 15, 2021
D
2
S CEO Aki Fujimura offers his views on Deep Learning and Digital Twins along with other industry experts
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Semiconductor Engineering: The Quest For Curvilinear Photomasks
News • April 15, 2021
D
2
S CPO Leo Pang and CEO Aki Fujimura explain why curvilinear masks matter
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Semiconductor Engineering: How Do Multi-Beam Mask Writers Enable Curvilinear Shapes On Photomasks?
News • April 15, 2021
Why multi-beam mask write time becomes constant no matter how complex the mask shapes.
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Semiconductor Engineering: Bending The Rules With Curvilinear Technology
News • April 5, 2021
TSMC’s Danping Peng looks at the historical hurdles for this technology.
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